Search Results - advanced+materials

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e-Black Surfaces

STFC's Accelerator Science department has developed a method of laser ablation to reduce secondary as well as photo-electron yields in particle accelerators and RF waveguides to less than 1.

Published: 08/06/2022

Keywords(s): 02.j. Aerospace Technology, 03.c. Apparatus Engineering, 03.c1 Wave-guides, 03.c2 Klystrons, 04. ENERGY, 04.c. Energy transmission and conversion, 04.e. Nuclear Fission/Nuclear Fusion, 05.f1 Accelerators

Category(s): Accelerator Technology, Manufacturing & Process Engineering, Advanced Materials, Scientific Instrumentation, Optics & Lasers

Electrospinning Scale-Up

STFC has a developed a high throughput manufacturing process for its previously patented electrospinning technology. This method addresses the need for an industrial scale electrospinning source with the ability to change the molecular content of the nanofibres with minimal time delay. IMAGES Published: 08/06/2022

Keywords(s): 02.b. Industrial Manufacture, 02.g. Materials Technology, 03.b. Process Plant Engineering, 03.d. Chemical Tech. & Engg., 04.a. Energy storage and transport, 05.b. Chemistry, 05.k. Nanotech. (physical science), 06.b. Biology/Biotechnology, 06.d. Micro- & Nanotech. (bioscience)

Category(s): Medical & Biomedical, Nanotechnology, Pharmaceuticals & Biologics, Scientific Instrumentation, Manufacturing & Process Engineering, Food & Beverage Technology, Energy & Alternative Fuel, Advanced Materials

Novel Cryostat

Engineers at STFC has developed and patented a cryostat with a rotatable mounting which allows the probing beam during spectroscopy experiments to remain static while rotating the sample. The rotating mechanism provides high precision which other non-static mounts fail at. IMAGES Published: 04/10/2024

Keywords(s): 03.c. Apparatus Engineering, 05.b. Chemistry, 05.f. Physics, 05.f2 Light Sources, 05.l. Cryogenics & Cryostats

Category(s): Advanced Materials, Scientific Instrumentation

Ionising Particle Analyser

STFC has developed a novel ionising particle analyser which enables the separation of the fluorescent yield and electron yield in EXAFS (extended X-ray absorption fine structure) measurements. The technology greatly improves the study of surface layers of materials using X-ray light sources. DESCRIPTIONMeasurement of electron yield is a known technique...

Published: 08/06/2022

Keywords(s): 01.h. Imaging & Detector Technology, 03.c. Apparatus Engineering, 05.b. Chemistry, 05.f. Physics, 05.f1 Accelerators, 05.f2 Light Sources, 06.b. Biology/Biotechnology, 09.a. Measurement Tools

Category(s): Advanced Materials, NDT, Scientific Instrumentation, Sensors & detectors, Pharmaceuticals & Biologics